|
Source : Redorbit.com |
|
Statistical Technique Improves Precision Of Nanotechnology DataA new statistical analysis technique that identifies and removes systematic bias, noise and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have future industrial applications.Known as sequential profile adjustment by regression (SPAR), the technique could also reduce the amount of experimental data required to make conclusions, and help distinguish true nanoscale phenomena from experimental error.
|
|
|
Last news on NEW TECHNOLOGY - Clean Energy :
|
|
|
| |
|
|
Today's Climate: March 21, 2010Senate Climate Bill to Give Free Permits: Sources (Reuters)
U.S. power generating companies would get free pollution permits, at least initially, as part of a compromise climate bill being written ... more
|
|
Saturday March,20
Friday March,19
Thursday March,18
|
|
Results 1 to 40 of about 2000 news.
|
|